45件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ) | |
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Y. Yamashita, R. Hasunuma, T. Nagata, T. Chikyow. Characterization of Interface State Density of SiO2/SiC (000-1) Based on Oxygen Concentration at the Interface during Thermal Oxidation. ECS Transactions. 75 [12] (2016) 201-206 10.1149/07512.0207ecst | |
Chad W. Mason, Irina Gocheva, Harry E. Hoster, Dennis Y.W. Yu. Activating Vanadium’s Highest Oxidation State in the NASICON Structure. ECS Transactions. 58 [12] (2014) 41-46 10.1149/05812.0041ecst | |
Yoshimi Kubo, Kimihiko Ito. Multicell Stack of Nonaqueous Lithium–Air Batteries. ECS Transactions. 62 [1] (2014) 129-135 10.1149/06201.0129ecst | |
Song-Zhu Chu, Kyosuke Osaka, Hitoshi Yashiro, Hiroyo Segawa, Kenji Wada, Satoru Inoue. Three-Dimensional Networked Nanoporous Anodic Alumina Films with Vertical and Transverse Pores Fabricated on Al With Different Purity. ECS Transactions. 58 [38] (2014) 61-70 10.1149/05838.0061ecst | |
D. Kim, S. Miyoshi, T. Tsuchiya, S. Yamaguchi. Improved Sintering Property of Y-Doped BaZrO3 by Mn Addition. ECS Transactions. 50 [44] (2013) 17-27 10.1149/05044.0017ecst | |
Ryoichi Aogaki, Kentarou Motomura, Ryoichi Morimoto, Atsushi Sugiyama, Iwao Mogi, Miki Asanuma, Makoto Miura, Yoshinobu Oshikiri, Yusuke Yamauchi. Examination of the Extinction Process of Ionic Vacancy by the Cyclotron MHD Electrode. ECS Transactions. 45 [12] (2013) 9-20 10.1149/04512.0009ecst | |
D. Y. Kim, S. Miyoshi, T. Tsuchiya, S. Yamaguchi. Defect Chemistry and Electrochemical Properties of BaZrO3 Heavily Doped with Fe. ECS Transactions. 45 [1] (2012) 161-170 10.1149/1.3701305 | |
Shin-ichi Motoda, Susumu Uematsu, SHINOHARA, Tadashi. Influence of Impurities in TiO2 Coatings on Electrode Potential of Photocatalytic Anode Assembling to Marine Microbial Fuel Cell. ECS TRANSACTIONS. 41 [31] (2012) 129-136 | |
Hiroyuki Masuda. Movement of Hydrogen during SCC of SUS310S Stainless Steel. ECS Transactions. 33 [35] (2011) 1-7 10.1149/1.3577748 | |
Yoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi. (Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation. ECS Transactions. 41 [7] (2011) 331-336 10.1149/1.3633313 | |