HOME > 論文 > 書誌詳細(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device OperationYoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi. ECS Transactions 41 [7] 331-336. 2011.https://doi.org/10.1149/1.3633313 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:25:17 +0900更新時刻: 2024-04-02 04:28:03 +0900
