(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation | SAMURAI, NIMS Researchers Directory Service

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(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation

Yoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi.

ECS Transactions 41 [7] 331-336. 2011.

https://doi.org/10.1149/1.3633313

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Created at: 2016-05-24 16:25:17 +0900 Updated at: 2026-10-08 06:13:43 +0900

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