HOME > 論文 > 書誌詳細Compressive creep behaviour of Yb4Si2O7N2 containing silicon nitride ceramic between 1400 and 1500 ℃(Yb4Si2O7N2含有窒化ケイ素の1400と1500℃の圧縮クリープ)S. Guo, N. Hirosaki, T. Nishimura, Y. Yamamoto, M. Mitomo. Materials Science and Technology 19 [4] 544-548. 2003.https://doi.org/10.1179/026708303225001911 NIMS著者郭 樹啓廣崎 尚登西村 聡之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 11:57:21 +0900 更新時刻: 2026-08-29 04:57:36 +0900