Single Atomic Defect Conductivity for Selective Dilute Impurity Imaging in 2D Semiconductors
Nam Thanh Trung Vu, Leyi Loh, Yuan Chen, Qingyun Wu, Ivan A. Verzhbitskiy, Kenji Watanabe, Takashi Taniguchi, Michel Bosman, Yee Sin Ang, Lay Kee Ang, Maxim Trushin, Goki Eda.
