Single Atomic Defect Conductivity for Selective Dilute Impurity Imaging in 2D Semiconductors

Nam Thanh Trung Vu; Leyi Loh; Yuan Chen; Qingyun Wu; Ivan A. Verzhbitskiy; Kenji Watanabe; Takashi Taniguchi; Michel Bosman; Yee Sin Ang; Lay Kee Ang; Maxim Trushin; Goki Eda; Nam Thanh Trung Vu; Leyi Loh; Yuan Chen; Qingyun Wu; Ivan A. Verzhbitskiy; Kenji Watanabe; Takashi Taniguchi; Michel Bosman; Yee Sin Ang; Lay Kee Ang; Maxim Trushin; Goki Eda

doi:10.1021/acsnano.3c02758

Single Atomic Defect Conductivity for Selective Dilute Impurity Imaging in 2D Semiconductors

Nam Thanh Trung Vu, Leyi Loh, Yuan Chen, Qingyun Wu, Ivan A. Verzhbitskiy, Kenji Watanabe, Takashi Taniguchi, Michel Bosman, Yee Sin Ang, Lay Kee Ang, Maxim Trushin, Goki Eda.

ACS Nano 17 [16] 15648-15655. 2023.

https://doi.org/10.1021/acsnano.3c02758

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2023-09-06 03:55:21 +0900 Updated at: 2026-11-09 08:50:32 +0900