HOME > 論文 > 書誌詳細Synchrotron analysis of structure transformations in V and V/Ag thin filmsA.K. Orlov, I.O. Kruhlov, O.V. Shamis, I.A. Vladymyrskyi, I.E. Kotenko, S.M. Voloshko, S.I. Sidorenko, T. Ebisu, K. Kato, H. Tajiri, O. Sakata, T. Ishikawa. Vacuum 150 186-195. 2018.https://doi.org/10.1016/j.vacuum.2018.01.044 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-02-21 20:45:41 +0900 更新時刻: 2026-11-04 06:26:22 +0900
