HOME > 論文 > 書誌詳細An Atomic resolution scanning tunneling microscope that applies external tensile stress and strain in an ultrahigh vacuumD Fujita, M Kitahara, K Onishi, K Sagisaka. Nanotechnology 19 [2] 025705. 2008.https://doi.org/10.1088/0957-4484/19/02/025705 NIMS著者藤田 大介大西 桂子鷺坂 恵介Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:21:40 +0900更新時刻: 2024-04-01 21:01:18 +0900
