HOME > 論文 > 書誌詳細Crystallite distribution analysis based on hydrogen content in thin-film nanocrystalline silicon solar cells by atom probe tomographyYasuo Shimizu, Hitoshi Sai, Takuya Matsui, Kenji Taki, Taiki Hashiguchi, Hirotaka Katayama, Mitsuhiro Matsumoto, Akira Terakawa, Koji Inoue, Yasuyoshi Nagai. Applied Physics Express 14 [1] 016501. 2021.https://doi.org/10.35848/1882-0786/abd13f NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-12-18 03:00:17 +0900更新時刻: 2024-04-02 02:01:28 +0900
