Crystallite distribution analysis based on hydrogen content in thin-film nanocrystalline silicon solar cells by atom probe tomography

Yasuo Shimizu; Hitoshi Sai; Takuya Matsui; Kenji Taki; Taiki Hashiguchi; Hirotaka Katayama; Mitsuhiro Matsumoto; Akira Terakawa; Koji Inoue; Yasuyoshi Nagai; Yasuo Shimizu; Hitoshi Sai; Takuya Matsui; Kenji Taki; Taiki Hashiguchi; Hirotaka Katayama; Mitsuhiro Matsumoto; Akira Terakawa; Koji Inoue; Yasuyoshi Nagai

doi:10.35848/1882-0786/abd13f

Crystallite distribution analysis based on hydrogen content in thin-film nanocrystalline silicon solar cells by atom probe tomography

Yasuo Shimizu, Hitoshi Sai, Takuya Matsui, Kenji Taki, Taiki Hashiguchi, Hirotaka Katayama, Mitsuhiro Matsumoto, Akira Terakawa, Koji Inoue, Yasuyoshi Nagai.

Applied Physics Express 14 [1] 016501. 2021.

https://doi.org/10.35848/1882-0786/abd13f

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-12-18 03:00:17 +0900Updated at: 2024-04-02 02:01:28 +0900