Atomic force microscopy and x-ray photoelectron spectroscopy studies of ZnO nanoparticles on SiO2 fabricated by ion implantation and thermal oxidation | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Atomic force microscopy and x-ray photoelectron spectroscopy studies of ZnO nanoparticles on SiO2 fabricated by ion implantation and thermal oxidation

H. Amekura, O. A. Plaksin, M. Yoshitake, Y. Takeda, N. Kishimoto, Ch. Buchal.

Applied Physics Letters 89 [2] 023115. 2006.

https://doi.org/10.1063/1.2221507

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作成時刻: 2016-05-24 14:59:44 +0900 更新時刻: 2026-09-28 04:23:17 +0900

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