Background Estimation in X-ray Photoelectron Spectroscopy Data Using an Active Shirley Method with Automated Selection of the Analytical Range | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Background Estimation in X-ray Photoelectron Spectroscopy Data Using an Active Shirley Method with Automated Selection of the Analytical Range

Ryo Murakami, Hironori Kageyama, Kazuki Nakamura, Hiromi Tanaka, Hiroshi Shinotsuka, Hideki Yoshikawa, Kazuhiro Yoshihara.

e-Journal of Surface Science and Nanotechnology 17 [0] 61-68. 2019.

https://doi.org/10.1380/ejssnt.2019.61

Open Access Surface Science Society Japan (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2020-05-02 03:00:18 +0900更新時刻: 2024-03-31 01:22:29 +0900

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