HOME > Article > DetailBackground Estimation in X-ray Photoelectron Spectroscopy Data Using an Active Shirley Method with Automated Selection of the Analytical RangeRyo Murakami, Hironori Kageyama, Kazuki Nakamura, Hiromi Tanaka, Hiroshi Shinotsuka, Hideki Yoshikawa, Kazuhiro Yoshihara. e-Journal of Surface Science and Nanotechnology 17 [0] 61-68. 2019.https://doi.org/10.1380/ejssnt.2019.61 Open Access Surface Science Society Japan (Publisher) NIMS author(s)SHINOTSUKA, HiroshiYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-05-02 03:00:18 +0900 Updated at: 2025-04-12 05:33:36 +0900