Yuichi Oshima; Elaheh Ahmadi; Stefan C. Badescu; Feng Wu; James S. Speck

doi:10.7567/apex.9.061102

Composition determination of β-(AlxGa1−x)2O3layers coherently grown on (010) β-Ga2O3substrates by high-resolution X-ray diffraction

著者	Yuichi Oshima, Elaheh Ahmadi, Stefan C. Badescu, Feng Wu, James S. Speck.
掲載誌名	Applied Physics Express 9 [6] 061102 ISSN: 18820786, 18820778, 09538984 ESIでのカテゴリ: PHYSICS
出版社	Japan Society of Applied Physics
発表年	2016
言語	English
DOI	https://doi.org/10.7567/apex.9.061102
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