SAMURAI - NIMS Researchers Database

HOME > 論文 > 詳細

Composition determination of β-(AlxGa1−x)2O3layers coherently grown on (010) β-Ga2O3substrates by high-resolution X-ray diffraction

著者Yuichi Oshima, Elaheh Ahmadi, Stefan C. Badescu, Feng Wu, James S. Speck.
掲載誌名Applied Physics Express 9 [6] 061102
ISSN: 18820786, 18820778, 09538984
ESIでのカテゴリ: PHYSICS
出版社Japan Society of Applied Physics
発表年2016
言語English
DOIhttps://doi.org/10.7567/apex.9.061102
この文献をMendeleyにインポートMendeley

▲ページトップへ移動