HOME > Article > DetailElectrical activities of stacking faults and partial dislocations in 4H-SiC homoepitaxial filmsCHEN, Bin, CHEN, Jun, SEKIGUCHI, Takashi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura, Filippo Fabbri. SUPERLATTICES AND MICROSTRUCTURES 295-300. 2009.NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-10-21 22:42:20 +0900 Updated at: 2022-10-21 22:42:20 +0900
