HOME > 論文 > 書誌詳細Electrical activities of stacking faults and partial dislocations in 4H-SiC homoepitaxial filmsCHEN, Bin, CHEN, Jun, SEKIGUCHI, Takashi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura, Filippo Fabbri. SUPERLATTICES AND MICROSTRUCTURES 295-300. 2009.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:42:20 +0900 更新時刻: 2022-10-21 22:42:20 +0900
