Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses

Yoshiharu Murase, Hiroyuki Masuda, Hideki Katayama.

MATERIALS TRANSACTIONS 61 [3] 482-489. 2020.

https://doi.org/10.2320/matertrans.mt-m2019338

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作成時刻: 2020-02-26 03:00:19 +0900更新時刻: 2024-11-13 05:16:36 +0900

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