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Preparation of 1 μm thick Y-doped HfO2 ferroelectric films on (111)Pt/TiO x /SiO2/(001)Si substrates by a sputtering method and their ferroelectric and piezoelectric properties

Reijiro Shimura, Takanori Mimura, Akinori Tateyama, Takao Shimizu, Tomoaki Yamada, Yoshitomo Tanaka, Yukari Inoue, Hiroshi Funakubo.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2021-04-20 03:00:19 +0900Updated at: 2024-06-04 08:40:43 +0900

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