HOME > 論文 > 書誌詳細Gate-modulated reflectance spectroscopy for detecting excitonic states in two-dimensional semiconductorsXUE, Mengsong, WATANABE, Kenji, TANIGUCHI, Takashi, KITAURA, Ryo. Applied Physics Letters 123 [6] 063101. 2023.https://doi.org/10.1063/5.0159245 Open Access Materials Data Repository (MDR) NIMS著者渡邊 賢司谷口 尚北浦 良Materials Data Repository (MDR)上の本文・データセットMDRavailable Gate-modulated reflectance spectroscopy for detecting excitonic states in two-dimensional semiconductors 作成時刻: 2023-10-06 03:21:41 +0900更新時刻: 2024-10-06 10:10:07 +0900