HOME > 論文 > 書誌詳細Micromagnetic analyses of reversal process with twisted wall structureTakehiko Yorozu, Xiao Hu. Journal of Applied Physics 95 [10] 5633-5640. 2004.https://doi.org/10.1063/1.1702099 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:38:38 +0900 更新時刻: 2026-10-29 04:31:17 +0900
