HOME > Article > DetailMicromagnetic analyses of reversal process with twisted wall structureTakehiko Yorozu, Xiao Hu. Journal of Applied Physics 95 [10] 5633-5640. 2004.https://doi.org/10.1063/1.1702099 NIMS author(s)HU, XiaoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:38:38 +0900Updated at: 2024-03-29 20:25:21 +0900
