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Quantitative Auger and X-Ray Photoelectron Analysis of Au-Cu alloys with Three kinds of Relative Sensitivity Factors
(AES およびXPSによる3種類の相対感度係数を用いたAu-Cu合金の定量分析)

TANUMA, Shigeo, KIMURA, Takashi.
JOURNAL OF SURFACE ANALYSIS 10 [2] 163-168. 2003.

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      Created at: 2016-05-24 11:56:17 +0900 Updated at: 2018-12-14 22:20:12 +0900

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