HOME > 論文 > 書誌詳細Structural evaluation of ions-implanted GaN films by photothermal deflection spectroscopy(N/A)Masatomo Sumiya, Kiyotaka Fukuda, Hideo Iwai, Tomohiro Yamaguchi, Takeyoshi Onuma, Tohru Honda. AIP Advances 8 [11] 115225. 2018.https://doi.org/10.1063/1.5052493 Open Access AIP Publishing (Publisher) NIMS著者角谷 正友岩井 秀夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-01 11:41:44 +0900更新時刻: 2024-03-31 01:36:57 +0900
