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Structural evaluation of ions-implanted GaN films by photothermal deflection spectroscopy
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Masatomo Sumiya, Kiyotaka Fukuda, Hideo Iwai, Tomohiro Yamaguchi, Takeyoshi Onuma, Tohru Honda.
AIP Advances 8 [11] 115225. 2018.
https://doi.org/10.1063/1.5052493
Open Access AIP Publishing (Publisher)

NIMS author(s)

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