HOME > Article > Detail電子分光法による表面分析の動向(A future trend of Surface analysis by electron sepctroscopy)田沼 繁夫, 岩井 秀夫, 吉川 英樹. ぶんせき 643-649. 2007.NIMS author(s)IWAI, HideoYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:21:42 +0900Updated at: 2018-12-14 23:34:10 +0900