HOME > Article > DetailElectron-beam-induced current study of hydrogen passivation on grain boundaries in multicrystalline silicon: Influence of GB character and impurity contaminationJun Chen, Deren Yang, Zhenqiang Xi, Takashi Sekiguchi. Physica B: Condensed Matter 364 [1-4] 162-169. 2005.https://doi.org/10.1016/j.physb.2005.04.008 NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:46:23 +0900Updated at: 2024-04-01 17:58:05 +0900