New sights into the electrochemical interface provided by in situ X-ray absorption fine structure and surface X-ray scattering | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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New sights into the electrochemical interface provided by in situ X-ray absorption fine structure and surface X-ray scattering
(その場XAFSおよびSXS法による電気化学界面計測の新展開)

Takuya Masuda, Toshihiro Kondo.

Current Opinion in Electrochemistry 14 81-88. 2019.

https://doi.org/10.1016/j.coelec.2018.12.012

NIMS著者

増田卓也

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2019-04-20 03:00:18 +0900更新時刻: 2024-04-02 01:26:47 +0900

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