New sights into the electrochemical interface provided by in situ X-ray absorption fine structure and surface X-ray scattering
(その場XAFSおよびSXS法による電気化学界面計測の新展開)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2019-04-20 03:00:18 +0900Updated at: 2024-04-02 01:26:47 +0900