HOME > 論文 > 書誌詳細Development of an Atomic Force Microscpoe Ultra-Micro Hardness testerwith a Silicon Tip for High-Resolution AFM ImagingNobuo NAGASHIMA, Kensuke MIYAHARA, Saburo MATSUOKA. JSME International Journal Series A 47 [3] 448-456. 2004.https://doi.org/10.1299/jsmea.47.448 NIMS著者長島 伸夫宮原 健介Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:32:15 +0900更新時刻: 2024-04-01 20:12:23 +0900
