Development of an Atomic Force Microscope Ultra-Microhardness Tester with a Silicon Tip for High-Resolution AFM Imaging

著者	Nobuo NAGASHIMA, Kensuke MIYAHARA, Saburo MATSUOKA.
掲載誌名	JSME International Journal Series A 47 [3] 448-456 ISSN: 13447912, 13475363
出版社	Japan Society of Mechanical Engineers
発表年	2004
言語	English
DOI	https://doi.org/10.1299/jsmea.47.448
この文献をMendeleyにインポート