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Development of an Atomic Force Microscpoe Ultra-Micro Hardness testerwith a Silicon Tip for High-Resolution AFM Imaging

Nobuo NAGASHIMA, Kensuke MIYAHARA, Saburo MATSUOKA.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2016-05-24 14:32:15 +0900 Updated at :2018-12-19 02:25:16 +0900

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