HOME > Article > DetailDevelopment of an Atomic Force Microscpoe Ultra-Micro Hardness testerwith a Silicon Tip for High-Resolution AFM ImagingNobuo NAGASHIMA, Kensuke MIYAHARA, Saburo MATSUOKA. JSME International Journal Series A 47 [3] 448-456. 2004.https://doi.org/10.1299/jsmea.47.448 NIMS author(s)NAGASHIMA, NobuoMIYAHARA, KensukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2016-05-24 14:32:15 +0900 Updated at :2018-12-19 02:25:16 +0900