SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Stress Release Drives Growth Transition of Quaterrylene Thin films on SiO2 Surfaces

The Journal of Physical Chemistry C 113 [6] 2197-2199. 2009.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2016-05-24 15:42:09 +0900Updated at: 2024-04-01 19:46:25 +0900

    ▲ Go to the top of this page