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Investigation of V-shaped extended defects in a 4H–SiC epitaxial film
(Investigation of V-shaped extended defects in a 4H–SiC epitaxial film)

Eita Tochigi, Hirofumi Matsuhata, Hirotaka Yamaguchi, Takashi Sekiguchi, Hajime Okumura, Yuichi Ikuhara.
Philosophical Magazine 97 [9] 657-670. 2017.
https://doi.org/10.1080/14786435.2016.1275869

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      作成時刻: 2017-06-27 22:20:12 +0900更新時刻: 2025-01-13 05:55:51 +0900

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