SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

Investigation of V-shaped extended defects in a 4H–SiC epitaxial film
(Investigation of V-shaped extended defects in a 4H–SiC epitaxial film)

Eita Tochigi, Hirofumi Matsuhata, Hirotaka Yamaguchi, Takashi Sekiguchi, Hajime Okumura, Yuichi Ikuhara.
Philosophical Magazine 97 [9] 657-670. 2017.
https://doi.org/10.1080/14786435.2016.1275869

NIMS著者

    Materials Data Repository (MDR)上の本文・データセット

      作成時刻: 2017-06-27 22:20:12 +0900更新時刻: 2024-04-01 23:36:14 +0900

      ▲ページトップへ移動