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Investigation of V-shaped extended defects in a 4H–SiC epitaxial film
(Investigation of V-shaped extended defects in a 4H–SiC epitaxial film)

Eita Tochigi, Hirofumi Matsuhata, Hirotaka Yamaguchi, Takashi Sekiguchi, Hajime Okumura, Yuichi Ikuhara.
Philosophical Magazine 97 [9] 657-670. 2017.

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      Created at :2017-06-27 22:20:12 +0900 Updated at :2022-10-22 02:39:50 +0900

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