HOME > 論文 > 書誌詳細ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic DeviceNaoki Banno, Toshitsugu Sakamoto, Munehiro Tada, Makoto Miyamura, Koichiro Okamoto, Hiromitsu Hada, Masakazu Aono. Japanese Journal of Applied Physics 50 [7] 074201. 2011.https://doi.org/10.1143/jjap.50.074201 NIMS著者青野 正和Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:42:55 +0900更新時刻: 2024-04-02 03:14:20 +0900
