ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device | SAMURAI, NIMS Researchers Directory Service

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ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device

Naoki Banno, Toshitsugu Sakamoto, Munehiro Tada, Makoto Miyamura, Koichiro Okamoto, Hiromitsu Hada, Masakazu Aono.

Japanese Journal of Applied Physics 50 [7] 074201. 2011.

https://doi.org/10.1143/jjap.50.074201

NIMS author(s)

AONO, Masakazu

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:42:55 +0900 Updated at: 2026-10-08 05:08:15 +0900

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