HOME > 論文 > 書誌詳細Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NbBa2Cu3O7-δThin Film(TPE法により作製されたNdBa2Cu3O7-δ薄膜 粒界接合の走査SQUID顕微鏡観察)Shunichi Arisawa, Kyungsung Yun, Kazuya Mochiduki, Ienari Iguchi, Takeshi Hatano, Huabing Wang, Akira Ishii. Transactions of the Materials Research Society of Japan 35 [1] 195-196. 2010.https://doi.org/10.14723/tmrsj.35.195 NIMS著者有沢 俊一羽多野 毅Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:03:04 +0900更新時刻: 2024-04-02 06:26:05 +0900