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Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NbBa2Cu3O7-δThin Film
(TPE法により作製されたNdBa2Cu3O7-δ薄膜　粒界接合の走査SQUID顕微鏡観察)

Shunichi Arisawa, Kyungsung Yun, Kazuya Mochiduki, Ienari Iguchi, Takeshi Hatano, Huabing Wang, Akira Ishii.
Transactions of the Materials Research Society of Japan 35 [1] 195-196. 2010.
https://doi.org/10.14723/tmrsj.35.195

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