HOME > 論文 > 書誌詳細Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron MicroscopyX Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, M Shimojo. Microscopy and Microanalysis 16 [S2] 290-291. 2010.https://doi.org/10.1017/s1431927610053870 NIMS著者竹口 雅樹橋本 綾子三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-06-08 20:59:46 +0900 更新時刻: 2026-10-03 04:27:43 +0900
