George H. Major; Joshua W. Pinder; Daniel E. Austin; Donald R. Baer; Steven L. Castle; Jan Čechal; B. Maxwell Clark; Hagai Cohen; Jonathan Counsell; Alberto Herrera-Gomez; Pavitra Govindan; Seong H. Kim; David J. Morgan; Robert L. Opila; Cedric J. Powell; Stanislav Průša; Adam Roberts; Mario Rocca; Naoto Shirahata; Tomáš Šikola; Emily F. Smith; Regina C. So; John E. Stovall; Jennifer Strunk; Andrew Teplyakov; Jeff Terry; Stephen G. Weber; Matthew R. Linford

doi:10.1116/6.0002437

HOME > 論文 > 書誌詳細

Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS)

George H. Major, Joshua W. Pinder, Daniel E. Austin, Donald R. Baer, Steven L. Castle, Jan Čechal, B. Maxwell Clark, Hagai Cohen, Jonathan Counsell, Alberto Herrera-Gomez, Pavitra Govindan, Seong H. Kim, David J. Morgan, Robert L. Opila, Cedric J. Powell, Stanislav Průša, Adam Roberts, Mario Rocca, Naoto Shirahata, Tomáš Šikola, Emily F. Smith, Regina C. So, John E. Stovall, Jennifer Strunk, Andrew Teplyakov, Jeff Terry, Stephen G. Weber, Matthew R. Linford.

Journal of Vacuum Science & Technology A 41 [3] 038501. 2023.

https://doi.org/10.1116/6.0002437

NIMS著者

白幡直人

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-05-19 03:17:36 +0900更新時刻: 2024-04-19 03:02:44 +0900