Analysis of Crystallographic Orientation of Elongated β-Si3N4 Particles in In Situ Si3N4 composite by Electron Back Scattered D | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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(Analysis of Crystallographic Orientation of Elongated β-Si3N4 Particles in In Situ Si3N4 composite by Electron Back Scattered D)

安富義幸, 坂井田喜久, HIROSAKI, Naoto, 幾原雄一.

Journal of the Ceramic Society of Japan 980-983. 1998.

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廣崎尚登

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作成時刻: 2022-09-05 10:52:52 +0900 更新時刻: 2022-09-05 10:52:52 +0900

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