Analysis of Crystallographic Orientation of Elongated β-Si3N4 Particles in In Situ Si3N4 composite by Electron Back Scattered D | SAMURAI, NIMS Researchers Directory Service

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(Analysis of Crystallographic Orientation of Elongated β-Si3N4 Particles in In Situ Si3N4 composite by Electron Back Scattered D)

安富義幸, 坂井田喜久, HIROSAKI, Naoto, 幾原雄一.

Journal of the Ceramic Society of Japan 980-983. 1998.

NIMS author(s)

HIROSAKI, Naoto

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-05 10:52:52 +0900 Updated at: 2022-09-05 10:52:52 +0900

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