Development of a Frequency-Domain Method Using Completely Optical Techniques for Measuring the Interfacial Thermal Resistance between the Metal Film and the Substrate | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Development of a Frequency-Domain Method Using Completely Optical Techniques for Measuring the Interfacial Thermal Resistance between the Metal Film and the Substrate

Ryozo Kato, Yibin Xu, Masahiro Goto.

Japanese Journal of Applied Physics 50 [10] 106602. 2011.

https://doi.org/10.1143/jjap.50.106602

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作成時刻: 2016-05-24 16:28:03 +0900 更新時刻: 2026-05-03 06:37:38 +0900

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