Direct Measurement of Terahertz Conductivity in a Gated Monolayer Semiconductor

Su-Di Chen; Qixin Feng; Wenyu Zhao; Ruishi Qi; Zuocheng Zhang; Dishan Abeysinghe; Can Uzundal; Jingxu Xie; Takashi Taniguchi; Kenji Watanabe; Feng Wang; Su-Di Chen; Qixin Feng; Wenyu Zhao; Ruishi Qi; Zuocheng Zhang; Dishan Abeysinghe; Can Uzundal; Jingxu Xie; Takashi Taniguchi; Kenji Watanabe; Feng Wang

doi:10.1021/acs.nanolett.5c01605

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Direct Measurement of Terahertz Conductivity in a Gated Monolayer Semiconductor

Su-Di Chen, Qixin Feng, Wenyu Zhao, Ruishi Qi, Zuocheng Zhang, Dishan Abeysinghe, Can Uzundal, Jingxu Xie, Takashi Taniguchi, Kenji Watanabe, Feng Wang.

Nano Letters 25 [19] 7998-8002. 2025.

https://doi.org/10.1021/acs.nanolett.5c01605

Open Access American Chemical Society (ACS) (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2025-05-27 03:07:04 +0900 更新時刻: 2025-11-02 04:40:34 +0900