HOME > 論文 > 書誌詳細Atomic Defect Quantification by Lateral Force MicroscopyYucheng Yang, Kaikui Xu, Luke N. Holtzman, Kristyna Yang, Kenji Watanabe, Takashi Taniguchi, James Hone, Katayun Barmak, Matthew R. Rosenberger. ACS Nano 18 [9] 6887-6895. 2024.https://doi.org/10.1021/acsnano.3c07405 NIMS著者渡邊 賢司谷口 尚Materials Data Repository (MDR)上の本文・データセット作成時刻: 2024-03-12 03:11:38 +0900更新時刻: 2024-03-29 10:27:53 +0900
