Atomic Defect Quantification by Lateral Force Microscopy

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Yucheng Yang, Kaikui Xu, Luke N. Holtzman, Kristyna Yang, Kenji Watanabe, Takashi Taniguchi, James Hone, Katayun Barmak, Matthew R. Rosenberger.

ACS Nano 18 [9] 6887-6895. 2024.

作成時刻: 2024-03-12 03:11:38 +0900 更新時刻: 2026-09-29 09:53:56 +0900