HOME > Article > DetailAtomic Defect Quantification by Lateral Force MicroscopyYucheng Yang, Kaikui Xu, Luke N. Holtzman, Kristyna Yang, Kenji Watanabe, Takashi Taniguchi, James Hone, Katayun Barmak, Matthew R. Rosenberger. ACS Nano 18 [9] 6887-6895. 2024.https://doi.org/10.1021/acsnano.3c07405 NIMS author(s)WATANABE, KenjiTANIGUCHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2024-03-12 03:11:38 +0900 Updated at: 2026-09-29 09:53:56 +0900
