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Reliability of magnetic tunnel junctions with a spinel MgAl2O4 film
(Reliability of magnetic tunnel junctions with a spinel MgAl2O4 film)

C.M. Choi, H. Sukegawa, S. Mitani, Y.H. Song.
Electronics Letters 53 [2] 119-121. 2017.
https://doi.org/10.1049/el.2016.3007

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    作成時刻: 2017-02-19 23:42:23 +0900更新時刻: 2024-04-02 00:30:34 +0900

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