HOME > Article > Detail Reliability of magnetic tunnel junctions with a spinel MgAl2O4 film (Reliability of magnetic tunnel junctions with a spinel MgAl2O4 film)C.M. Choi, H. Sukegawa, S. Mitani, Y.H. Song. Electronics Letters 53 [2] 119-121. 2017.https://doi.org/10.1049/el.2016.3007 NIMS author(s)SUKEGAWA, HiroakiMITANI, SeijiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-19 23:42:23 +0900Updated at: 2024-10-11 04:17:39 +0900