Bias-voltage application in a hard X-ray photoelectron spectroscopic study of the interface states at oxide/Si(100) interfaces | SAMURAI, NIMS Researchers Directory Service

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Bias-voltage application in a hard X-ray photoelectron spectroscopic study of the interface states at oxide/Si(100) interfaces

YAMASHITA, Yoshiyuki, CHIKYOW, Toyohiro, Keisuke Kobayashi.

SPring-8 Research Frontiers 2013 2013 54-55. 2014.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:24:15 +0900Updated at: 2018-12-14 22:57:08 +0900

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