Enhancing the optical characterization of mediator-assisted wafer-scale MoS2 and WS2 on h-BN

Sheng-Kuei Chiu; Ming-Chi Li; Ji-Wei Ci; Yuan-Chih Hung; Dung-Sheng Tsai; Chien-Han Chen; Li-Hung Lin; Kenji Watanabe; Takashi Taniguchi; Nobuyuki Aoki; Ya-Ping Hsieh; Chiashain Chuang

doi:10.1088/1361-6528/acc5f1

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Enhancing optical characteristics of mediator-assisted wafer-scale MoS2 and WS2 on h-BN
(Enhancing the optical characterization of mediator-assisted wafer-scale MoS2 and WS2 on h-BN)

Sheng-Kuei Chiu, Ming-Chi Li, Ji-Wei Ci, Yuan-Chih Hung, Dung-Sheng Tsai, Chien-Han Chen, Li-Hung Lin, Kenji Watanabe, Takashi Taniguchi, Nobuyuki Aoki, Ya-Ping Hsieh, Chiashain Chuang.

Nanotechnology 34 [25] 255703. 2023.

https://doi.org/10.1088/1361-6528/acc5f1

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-06-02 03:18:24 +0900更新時刻: 2024-04-26 03:02:53 +0900

Enhancing optical characteristics of mediator-assisted wafer-scale MoS2 and WS2 on h-BN(Enhancing the optical characterization of mediator-assisted wafer-scale MoS2 and WS2 on h-BN)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Enhancing optical characteristics of mediator-assisted wafer-scale MoS2 and WS2 on h-BN
(Enhancing the optical characterization of mediator-assisted wafer-scale MoS2 and WS2 on h-BN)