Structural and interfacial stabilities of epitaxial (11(2)over-bar0)-oriented wurtzite AlN films grown on lattice-matched MnS buffered Si(100) | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Structural and interfacial stabilities of epitaxial (11(2)over-bar0)-oriented wurtzite AlN films grown on lattice-matched MnS buffered Si(100)

J.H. Song, Y.Z. Yoo, T. Chikyow, H. Koinuma.

Applied Physics A 79 [3] 457-460. 2004.

https://doi.org/10.1007/s00339-004-2664-4

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作成時刻: 2016-05-24 14:41:06 +0900 更新時刻: 2026-09-30 04:25:29 +0900

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