Structural and interfacial stabilities of epitaxial (11(2)over-bar0)-oriented wurtzite AlN films grown on lattice-matched MnS buffered Si(100) | SAMURAI, NIMS Researchers Directory Service

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Structural and interfacial stabilities of epitaxial (11(2)over-bar0)-oriented wurtzite AlN films grown on lattice-matched MnS buffered Si(100)

J.H. Song, Y.Z. Yoo, T. Chikyow, H. Koinuma.

Applied Physics A 79 [3] 457-460. 2004.

https://doi.org/10.1007/s00339-004-2664-4

NIMS author(s)

CHIKYO, Toyohiro

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 14:41:06 +0900 Updated at: 2026-11-01 04:25:10 +0900

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