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Positive Hall coefficients obtained from contact misplacement on evident n-type ZnO films and crystals
(n型ZnO薄膜、結晶への誤った接触による正のホール係数)

Takeshi Ohgaki, Naoki Ohashi, Shigeaki Sugimura, Haruki Ryoken, Isao Sakaguchi, Yutaka Adachi, Hajime Haneda.
Journal of Materials Research 23 [09] 2293-2295. 2008.

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    Created at: 2016-05-24 15:35:00 +0900 Updated at: 2026-10-01 04:32:24 +0900

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