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Annealing behaviors of vacancy-type defects near interfaces between metal contacts and GaN probed using a monoenergetic positron beam

著者Akira Uedono, Tatsuya Fujishima, Daniel Piedra, Nakaaki Yoshihara, Shoji Ishibashi, Masatomo Sumiya, Oleg Laboutin, Wayne Johnson, Tomás Palacios.
掲載誌名Applied Physics Letters 105 [5] 052108
ISSN: 00036951, 10773118
ESIでのカテゴリ: PHYSICS
出版社AIP Publishing
発表年2014
言語English
DOIhttps://doi.org/10.1063/1.4892834
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