HOME > 論文 > 書誌詳細Annealing behaviors of vacancy-type defects near interfaces between metal contacts and GaN probed using a monoenergetic positron beamAkira Uedono, Tatsuya Fujishima, Daniel Piedra, Nakaaki Yoshihara, Shoji Ishibashi, Masatomo Sumiya, Oleg Laboutin, Wayne Johnson, Tomás Palacios. Applied Physics Letters 105 [5] 052108. 2014.https://doi.org/10.1063/1.4892834 NIMS著者角谷 正友Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:44:50 +0900更新時刻: 2024-04-02 06:17:50 +0900
