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Annealing behaviors of vacancy-type defects near interfaces between metal contacts and GaN probed using a monoenergetic positron beam

Akira Uedono, Tatsuya Fujishima, Daniel Piedra, Nakaaki Yoshihara, Shoji Ishibashi, Masatomo Sumiya, Oleg Laboutin, Wayne Johnson, Tomás Palacios.
Applied Physics Letters 105 [5] 052108. 2014.
https://doi.org/10.1063/1.4892834

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